Diffusing-wave spectroscopy contribution to strain analysis.
Résumé
We present a new full-field strain measurement method based on diffusing-wave spectroscopy. Our technique makes it possible to measure strains in the vicinity of the surface of highly light-scattering materials. Its main feature is an extreme sensitivity: the range of deformations measured is 10−5-10−3. To validate the measurements, experimental results from several plane stress configurations are compared with theoretical and numerical calculations. Furthermore, we propose an extension of the method for non-scattering materials.