Conference Papers
Year : 2013
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https://hal.science/hal-00811778
Submitted on : Thursday, April 11, 2013-10:10:40 AM
Last modification on : Wednesday, January 24, 2024-9:54:18 AM
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- HAL Id : hal-00811778 , version 1
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N. Clement, K. Nishiguchi, D. Vuillaume, A. Fujiwara. Dielectric polarization 1/f noise : a signature of defect-free oxides at nanotransistors interface. American Physical Society March Meeting, APS March Meeting 2013, 2013, Baltimore, MD, United States. ⟨hal-00811778⟩
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