An exhaustive study of laser damage in ion beam sputtered pure and mixture oxide thin films at 1030 nm with 500 fs pulse durations
Laurent Gallais
(1)
,
Benoit Mangote
(1)
,
Mireille Commandre
(1)
,
M. Mende
(2)
,
L. Jensen
(2)
,
H. Ehlers
(2)
,
Marco Jupe
(2)
,
D. Ristau
(2)
,
Andrius Melnikaitis
(3)
,
Valdas Sirutkaitis
(3)
,
Simonas Kicas
(4)
,
Tomas Tolenis
(4)
Laurent Gallais
- Fonction : Auteur
- PersonId : 758
- IdHAL : laurent-gallais
- ORCID : 0000-0002-6806-4313
- IdRef : 071023143