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Communication Dans Un Congrès Année : 2012

A predictive bottom-up hierarchical approach to digital system reliability

Résumé

This work has introduced a new electrical aging assessment framework for digital systems, based upon strong physics-based foundations and an adequate bottom-up approach which enables propagating accurate reliability knowledge at system level. This work opens new ways to optimize high level digital systems with respect to aging with great accuracy.
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Dates et versions

hal-00747363 , version 1 (31-10-2012)

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Citer

V. Huard, E. Pion, F. Cacho, D. Croain, V. Robert, et al.. A predictive bottom-up hierarchical approach to digital system reliability. IEEE International Reliability Physics Symposium (IRPS'12), Apr 2012, Anaheim, CA, United States. pp.4B.1.1 - 4B.1.10, ⟨10.1109/IRPS.2012.6241830⟩. ⟨hal-00747363⟩

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