Reliability-Based Design Optimization using Local Sensitivity, Application to Magnetic Nano Switch - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2012

Reliability-Based Design Optimization using Local Sensitivity, Application to Magnetic Nano Switch

Fichier non déposé

Dates et versions

hal-00741409 , version 1 (12-10-2012)

Identifiants

  • HAL Id : hal-00741409 , version 1

Citer

Phuong Pham Quang, Benoît Delinchant, Jean-Louis Coulomb. Reliability-Based Design Optimization using Local Sensitivity, Application to Magnetic Nano Switch. OIPE 2012, 12th International Workshop on Optimization and Inverse Problems in Electromagnetism, Sep 2012, Ghent, Belgium. ⟨hal-00741409⟩
51 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More