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Article Dans Une Revue Physical Review B: Condensed Matter and Materials Physics (1998-2015) Année : 2010

Interface polaron formation in organic field-effect transistors

Résumé

A model describing the low-density carrier state in an organic single-crystal field-effect transistor (FET) with high-κ gate dielectrics is studied. The interplay between charge-carrier coupling with intermolecular vibrations in the bulk of the organic material and the long-range interaction induced at the interface with a polar dielectric is investigated. This interplay is responsible for the stabilization of a polaronic state with an internal structure extending on few lattice sites, at much lower coupling strengths than expected from the polar interaction alone. This effect could drive the carriers close to self-trapping in high-κ organic FETs without invoking unphysically large values of the carrier-interface interaction.

Dates et versions

hal-00704599 , version 1 (05-06-2012)

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Giulio Dr. de Filippis, Vittorio Cataudella, Simone Fratini, S. Ciuchi. Interface polaron formation in organic field-effect transistors. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2010, 82 (20), pp.205306. ⟨10.1103/PhysRevB.82.205306⟩. ⟨hal-00704599⟩

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