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Article Dans Une Revue Langmuir Année : 2012

Dual-Frequency Electrowetting: Application to Drop Evaporation Gauging within a Digital Microsystem

Résumé

This paper addresses a method to estimate the size of a sessile drop and to measure its evaporation kinetics by making use of both Michelson interferometry and coplanar electrowetting. From a high-frequency electrowetting voltage, the contact angle of the sessile droplet is monitored to permanently obtain a half-liquid sphere, thus complying perfectly with the drop evaporation theory based on a constant contact angle (Bexon, R.; Picknett, R. J. Colloid Interface Sci. 1977, 61, 336-350). Low-frequency modulation of the electrowetting actuation is also applied to cause droplet shape oscillations and capillary resonance. Interferometry allows us to measure a time-dependent capillary spectrum and, in particular, the shift in natural frequencies induced by drop evaporation. Consequently, diffusive kinetics of drop evaporation can be properly estimated, as demonstrated. Because of coplanar electrode configuration, our methodology can be integrated in open and covered microsystems, such as digital lab-on-a-chip devices.

Domaines

Matériaux
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Dates et versions

hal-00675001 , version 1 (28-02-2012)

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Paternité

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Johannes Theisen, Laurent Davoust. Dual-Frequency Electrowetting: Application to Drop Evaporation Gauging within a Digital Microsystem. Langmuir, 2012, 28 (1), pp.1041-1048. ⟨10.1021/la203645t⟩. ⟨hal-00675001⟩
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