Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests - Archive ouverte HAL
Article Dans Une Revue Electronics Letters Année : 2010

Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests

Résumé

Presented is an original study about the effects of integrated circuit aging on electromagnetic emission and immunity to radio frequency interferences. For the first time an electromagnetic compatibility (EMC) qualification procedure is proposed to quantify the EMC level variation over the full lifetime of a component. Results presented show non-negligible variations of the emission and immunity thresholds after accelerated life tests, which could seriously deteriorate EMC margins required to ensure compliance with standard EMC levels.

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Electronique
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https://hal.science/hal-00669745

Soumis le : lundi 13 février 2012-17:54:19

Dernière modification le : lundi 20 novembre 2023-11:44:22

Archivage à long terme le : lundi 14 mai 2012-02:51:33

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Dates et versions

hal-00669745 , version 1 (13-02-2012)

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Sonia Ben Dhia, Alexandre Boyer, Binhong Li, Amadou Ndoye Cisse. Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests. Electronics Letters, 2010, 46 (4), p. 278-280. ⟨10.1049/el.2010.2885⟩. ⟨hal-00669745⟩

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