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structural characterization of MBE grown GaP/Si nanolayers

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hal-00654309 , version 1 (21-12-2011)

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  • HAL Id : hal-00654309 , version 1

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Weiming Guo, Georges Elias, Antoine Létoublon, Charles Cornet, Anne Ponchet, et al.. structural characterization of MBE grown GaP/Si nanolayers. euro-MBE, Mar 2011, Alpe d'Huez, France. ⟨hal-00654309⟩
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