How supercapacitors reach end of life criteria during calendar life and power cycling tests - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Microelectronics Reliability Année : 2011

How supercapacitors reach end of life criteria during calendar life and power cycling tests

Domaines

Electronique

Dates et versions

hal-00641859 , version 1 (16-11-2011)

Identifiants

Citer

Ramzi Chaari, Olivier Briat, Jean-Yves Delétage, Eric Woirgard, Jean-Michel Vinassa. How supercapacitors reach end of life criteria during calendar life and power cycling tests. Microelectronics Reliability, 2011, 51 (9-11), pp.1976-1979. ⟨10.1016/j.microrel.2011.07.014⟩. ⟨hal-00641859⟩
70 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More