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Communication Dans Un Congrès Année : 2010
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hal-00604921 , version 1 (30-06-2011)

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  • HAL Id : hal-00604921 , version 1

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G. Ghibaudo, C. Mezzomo, A. Bajolet, A. Cathignol, R. Difrenza. Characterization and modelling of device variability in advanced CMOS technologies. Int. workshop on Simulation and Characterization of Statistical CMOS Variability and Reliability, 2010, Bologna, Italy. ⟨hal-00604921⟩
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