Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation - Archive ouverte HAL Access content directly
Conference Papers Year : 2010

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation

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hal-00585666 , version 1 (13-04-2011)

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  • HAL Id : hal-00585666 , version 1

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F. Infante, Philippe Perdu, Dean Lewis. Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation. 20th European Symposium Reliabilty on Electron Devices, Failure Physics and Analysis (ESREF) 2010, Oct 2010, Monteccassino, Italy. pp.1. ⟨hal-00585666⟩
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