Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods - Archive ouverte HAL Access content directly
Journal Articles Advanced Materials Year : 2011

Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods

No file

Dates and versions

hal-00581240 , version 1 (30-03-2011)

Identifiers

  • HAL Id : hal-00581240 , version 1

Cite

C. Barth, A.S. Foster, C.R. Henry, A.L. Shluger. Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods. Advanced Materials, 2011, 23 (4), pp.477-501. ⟨hal-00581240⟩
24 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More