Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2010

Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies

Résumé

The use of deeper-submicron technologies in integrated circuits worsens the effects of transient faults. In fact, the transient-fault durations become as important as the clock periods of synchronous circuits. Electronic systems are thus more vulnerable to failure situations. Nevertheless, this paper shows innovatively that such a worse scenario does not happen in asynchronous circuits. This additional novel benefit pushes on the asynchronous design as a better alternative to mitigate transient faults in deep-submicron technology-based circuits.
Fichier non déposé

Dates et versions

hal-00568749 , version 1 (23-02-2011)

Identifiants

  • HAL Id : hal-00568749 , version 1

Citer

Rodrigo Possamai Bastos, G. Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis. Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies. Digest of Papers, 15th IEEE European Test Symposium (ETS'10), May 2010, Prague, Czech Republic. ⟨hal-00568749⟩

Collections

UGA CNRS TIMA
238 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More