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Article Dans Une Revue Key Engineering Materials Année : 2011

K-S Relationship Identification Technique by EBSD

Résumé

This paper focuses on the identification of activated slip system in flat specimens of hot- and cold-rolled UNS S32750 DSS plates subjected to low-cycle fatigue, paying particular attention on the existence of the K-S relationship. Electron Backscattered Diffraction (EBSD) technique was used to determine the local crystallographic properties of both phases. Although 27182 couples of α/γ grains were analyzed, the crystallographic K-S relationships were rarely observed between them. As a conclusion, it was observed that microcracks were mostly nucleated at grain boundaries and rarely at the extrusions.
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Dates et versions

hal-00559217 , version 1 (25-01-2011)

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Maria-Cecilia Marinelli, M.G. Moscato, Javier W. Signorelli, Ahmed El Bartali, Iris Alvarez-Armas. K-S Relationship Identification Technique by EBSD. Key Engineering Materials, 2011, 465, pp.415-418. ⟨10.4028/www.scientific.net/KEM.465.415⟩. ⟨hal-00559217⟩

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