Nanoindentation and Atomic Force Microscopy basic principles - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2009

Nanoindentation and Atomic Force Microscopy basic principles

Olivier Arnould

Résumé

This course focuses on the measurement of viscoelastic properties at the lowest scale level by using nanoindentation and AFM devices. It begins with an introductory lecture on the basic concept of contact mechanics based on the Hertzian theory for linear elastic isotropic solids and its extension to the case of depth-sensing indentation. The extension to the case of elastic anisotropic solids will be briefly tackled. Then, nanoindenter and Atomic Force Microscope's (commercial) implementation, calibration(s) and classical operating principles for mechanical measurements (single point or mapping mode) are described together with a brief review on data interpretations. This course will end with a short discussion on measurement and scale of observation possibilities, limitation of each technique for measuring mechanical properties of wood components at the submicrometre scale and nowadays developments.
Fichier non déposé

Dates et versions

hal-00546241 , version 1 (14-12-2010)

Identifiants

  • HAL Id : hal-00546241 , version 1

Citer

Olivier Arnould. Nanoindentation and Atomic Force Microscopy basic principles. COST FP0802 Spring School Lecture Notes, 2009, Vienne, Austria. 12p. ⟨hal-00546241⟩
52 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More