In situ study of the quasicrystal growth by synchrotron X-ray imaging
Résumé
One of the main challenges of the quasicrystal science is to elucidate how the quasiperiodic order can extend so far, i.e. up to several centimeters according to the size of the single grains of various alloys routinely grown nowadays [1, 2, 3]. Noticing that most of the present knowledge on the growth of quasicrystal grains has been collected after their cooling at room temperature, we have carried out the first in situ and real time observation of this peculiar process which has clearly disclosed both, the shape of the growing interface and its defective state. Therefore we have studied the solidification of an AlPdMn alloy giving quasicrystal grains by synchrotron X-ray imaging, combining thereby the radiography and X-ray topography techniques. Radiography allowed us to clearly evidence a facetted growth proceeding by lateral motion of ledges at the solid-melt interface and controlled by the interface kinetics rather than by the local heat flow as widely thought. Thus a realistic estimate of the kinetic coefficient was deduced from the solid-melt interface undercooling which indicates that the quasicrystal growth is more likely comparable to both semiconductor and oxide growths than to pure metal growth. The X-ray topographs recorded simultaneously with radiographs, revealed that a lot of strains and defects are generated in the quasicrystal grains during their growth, which could be related to the growth process itself and very informative on the origin of the stability of the quasicrystal lattice.
Domaines
Physique [physics]| Origine | Fichiers produits par l'(les) auteur(s) |
|---|
Loading...