A multigrid X-FEM strategy for 3D fatigue crack growth simulation - Archive ouverte HAL Access content directly
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hal-00506161 , version 1 (27-07-2010)

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  • HAL Id : hal-00506161 , version 1

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Johann Rannou, Anthony Gravouil, Marie-Christine Baietto. A multigrid X-FEM strategy for 3D fatigue crack growth simulation. WCCM8, Jun 2008, Italie. ⟨hal-00506161⟩
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