An inference method for temperature step-stress accelerated life testing - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Quality and Reliability Engineering International Année : 2000

An inference method for temperature step-stress accelerated life testing

Fichier non déposé

Dates et versions

hal-00493848 , version 1 (21-06-2010)

Identifiants

  • HAL Id : hal-00493848 , version 1

Citer

Evans Gouno. An inference method for temperature step-stress accelerated life testing. Quality and Reliability Engineering International, 2000, 16, pp.11-18. ⟨hal-00493848⟩
56 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More