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Communication Dans Un Congrès Année : 2006

Reliability of the extrapolated OLED lifetime from stretched exponential decay fit diode

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hal-00437438 , version 1 (30-11-2009)

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  • HAL Id : hal-00437438 , version 1

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H. Cloarec, D. Vaufrey, Tayeb Mohammed-Brahim, T. Maindron, Christophe Prat. Reliability of the extrapolated OLED lifetime from stretched exponential decay fit diode. Eurodisplays, Sep 2006, Moscou, France. pp.S12.3. ⟨hal-00437438⟩
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