Determination of interface state distribution in polysilicon thin film transistors from low frequency -noise measurements: application to analysis of electrical properties - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Applied Physics Année : 2006

Determination of interface state distribution in polysilicon thin film transistors from low frequency -noise measurements: application to analysis of electrical properties

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hal-00437321 , version 1 (30-11-2009)

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  • HAL Id : hal-00437321 , version 1

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Laurent Pichon, Abdelmalek Boukhenoufa, Christophe Cordier, Bogdan Cretu. Determination of interface state distribution in polysilicon thin film transistors from low frequency -noise measurements: application to analysis of electrical properties. Journal of Applied Physics, 2006, 100 (5), pp.54504-54509. ⟨hal-00437321⟩
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