Article Dans Une Revue Applied Physics Letters Année : 2007

Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics

Résumé

To overcome the limitations in terms of spatial resolution and field of view of existing tomography techniques, a hard x-ray projection microscope is realized based on the sub- 100-nm focus produced by Kirkpatrick-Baez optics. The sample is set at a small distance downstream of the focus and Fresnel diffraction patterns with variable magnification are recorded on a medium-resolution detector. While the approach requires a specific phase retrieval procedure and correction for mirror imperfections, it allows zooming nondestructively into bulky samples. Quantitative three-dimensional nanoscale microscopy is demonstrated on an aluminum alloy in local tomography mode.

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hal-00434198 , version 1 (18-05-2023)

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R. Mokso, P. Cloetens, Eric Maire, Wolfgang Ludwig, Jean-Yves Buffiere. Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics. Applied Physics Letters, 2007, 90 (14), pp.1-3. ⟨10.1063/1.2719653⟩. ⟨hal-00434198⟩
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