Failure analysis enhancement by evaluating the thermal laser stimulation impact on analog ICs - Archive ouverte HAL Access content directly
Conference Papers Year : 2008
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hal-00401695 , version 1 (03-07-2009)

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  • HAL Id : hal-00401695 , version 1

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Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Olivier Crepel, Dean Lewis. Failure analysis enhancement by evaluating the thermal laser stimulation impact on analog ICs. International Symposium on the Physical and Failure Analysis on Integrated Circuits (IPFA), 2008, Suzhou, China. pp.1-6. ⟨hal-00401695⟩
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