Effect of physical defect on shmoos in CMOS DSM technologies - Archive ouverte HAL Access content directly
Journal Articles Microelectronics Reliability Year : 2008
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hal-00401309 , version 1 (02-07-2009)

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  • HAL Id : hal-00401309 , version 1

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A. Machouat, G. Haller, V. Goubier, Dean Lewis, Philippe Perdu, et al.. Effect of physical defect on shmoos in CMOS DSM technologies. Microelectronics Reliability, 2008, 48, pp.1333-1338. ⟨hal-00401309⟩
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