Journal Articles
Microelectronics Reliability
Year : 2008
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https://hal.science/hal-00401309
Submitted on : Thursday, July 2, 2009-6:47:36 PM
Last modification on : Friday, March 24, 2023-2:52:52 PM
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- HAL Id : hal-00401309 , version 1
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A. Machouat, G. Haller, V. Goubier, Dean Lewis, Philippe Perdu, et al.. Effect of physical defect on shmoos in CMOS DSM technologies. Microelectronics Reliability, 2008, 48, pp.1333-1338. ⟨hal-00401309⟩
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