Journal Articles Fluctuation and Noise Letters Year : 2008
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hal-00391713 , version 1 (04-06-2009)

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  • HAL Id : hal-00391713 , version 1

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L. Zafari, J. Jomaah, G. Ghibaudo. Modeling and simulation of coupling effect on low frequency noise in advance SOI MOSFETs.. Fluctuation and Noise Letters, 2008, 8, L87. ⟨hal-00391713⟩
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