Journal Articles
Fluctuation and Noise Letters
Year : 2008
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Submitted on : Thursday, June 4, 2009-3:18:15 PM
Last modification on : Saturday, September 27, 2025-7:53:38 PM
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- HAL Id : hal-00391713 , version 1
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L. Zafari, J. Jomaah, G. Ghibaudo. Modeling and simulation of coupling effect on low frequency noise in advance SOI MOSFETs.. Fluctuation and Noise Letters, 2008, 8, L87. ⟨hal-00391713⟩
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