Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light, - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Materials Science and Engineering: A Année : 2009

Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light,

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hal-00389387 , version 1 (28-05-2009)

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  • HAL Id : hal-00389387 , version 1

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A.R. Kilmametov, G. Vaughan, A.R. Yavari, A. Lemoulec, W.J. Botta, et al.. Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light,. Materials Science and Engineering: A, 2009, A503, pp.10-13. ⟨hal-00389387⟩

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