Compact 3-D On-Wafer Radiation Pattern Measurement System for 60 GHz Antennas - Archive ouverte HAL
Article Dans Une Revue Microwave and Optical Technology Letters Année : 2008

Compact 3-D On-Wafer Radiation Pattern Measurement System for 60 GHz Antennas

Résumé

This article presents a quasi full 3‐D on‐wafer radiation pattern measurement system for 60 GHz antennas. The measurement of an omnidirectional antenna is reported and shows promising results. The radiation of the probe itself as well as the effects of a connector feeding the antenna are also studied.

Dates et versions

hal-00366584 , version 1 (09-03-2009)

Identifiants

Citer

S. Ranvier, M. Kyrö, C. Icheln, Cyril Luxey, Robert Staraj, et al.. Compact 3-D On-Wafer Radiation Pattern Measurement System for 60 GHz Antennas. Microwave and Optical Technology Letters, 2008, 51 (2), pp.319-324. ⟨10.1002/mop.24034⟩. ⟨hal-00366584⟩
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