Automatic generation of symbolic test purposes - Archive ouverte HAL
Communication Dans Un Congrès Année : 2005

Automatic generation of symbolic test purposes

Résumé

We present a technique dedicated to compute automatically sets of test purposes from IOSTS specification. A coverage criterion, namely the inclusion criterion, is defined. Inclusion criterion is dedicated to decide whether set of test purposes are sufficiently complete or not. Test case generation is then studied.
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Dates et versions

hal-00342173 , version 1 (26-11-2008)

Identifiants

  • HAL Id : hal-00342173 , version 1

Citer

Assia Touil, Christophe Gaston, Pascale Le Gall. Automatic generation of symbolic test purposes. Proceedings of the second MoDeVa (Model Design and Validation) workshop, 2005, Jamaica. pp.n.a. ⟨hal-00342173⟩
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