Afterglow mode and the new Micro Pulsed Beam mode applied to an ECR Ion Source
Résumé
An increasing number of experiments in the field of low energy ion physics (< 25 keV/charge) requires pulsed beams of highly charged ions. Whereas for high-intensity beams (> µA) a pulsed beam chopper, installed downstream to the analyzing dipole, is used. For low-intensity beams (< 100 nA) the ion intensity delivered during the pulse may be increased by operating the ECR discharge in the afterglow mode [1]. This method gives satisfactory results (ie average current during the beam pulse is higher than the current in the CW mode) for high charge state ions. In this paper, we report on results of the afterglow mode for beams of 22Neq+, 36Arq+ and 84Krq+ ions. Furthermore, a new promising “Micro Pulsed Beam” mode will be described with encouraging preliminary results for 84Kr27+ and 36Ar17+ ions.
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