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Article Dans Une Revue Microelectronics Reliability Année : 2008

Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications

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Electronique
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hal-00334728 , version 1 (27-10-2008)

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  • HAL Id : hal-00334728 , version 1

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M.L. Bourqui, L. Bechou, O. Gilard, Y. Deshayes, P. del Vecchio, et al.. Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. Microelectronics Reliability, 2008, 48, pp.1202-1207. ⟨hal-00334728⟩
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