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Article Dans Une Revue Journal of Non-Crystalline Solids Année : 2008

Titanium reduction processes in oxide glasses under electronic irradiation

Résumé

Borosilicate and disilicate glasses doped with 0–2 mol% of TiO2 have been irradiated with 2 MeV electrons. Reduction of Ti4+ is attested by the presence of an intense electronic paramagnetic resonance (EPR) signal around g = 1.92 corresponding to Ti3+, not observed in samples that were not irradiated. Moreover, two distinct sites of Ti3+ have been detected in each glass composition. Ti–K-edge X-ray absorption near edge structure (XANES) experiment and more precisely the pre-edge analysis of non-irradiated samples indicates the presence of four, five and six coordinated Ti(IV) in borosilicate glass compositions. In contrast, the average Ti(IV) coordination in DS composition is a mixture between fivefold and sixfold. In irradiated glasses, the Ti–K-edge energy (as well as the pre-edge position) shows a shift to smaller energies, which we suggest is caused by Ti3+. Comparison between EPR, Raman and XANES results in a coherent description of Ti4+ reduction process in the glass samples
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Dates et versions

hal-00324202 , version 1 (24-09-2008)

Identifiants

  • HAL Id : hal-00324202 , version 1

Citer

N. Ollier, P. Lombard, F. Farges, B. Boizot. Titanium reduction processes in oxide glasses under electronic irradiation. Journal of Non-Crystalline Solids, 2008, 354 (2-9), pp.480-485. ⟨hal-00324202⟩
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