A Temperature and Power Supply Independent CMOS Voltage Reference for Built-In Self-Test
Résumé
In this paper, the design of a temperature independent voltage reference for built-in self-test applications is presented; starting from BIST results on a 2.4 GHz LNA carried out monitoring a voltage node of the circuit, the need for a rapidly exportable temperature independent voltage reference is shown. The voltage reference – designed in STM 65 nm CMOS technology – works with a 0.9 V supply voltage and the low power consumption at room temperature of 27 μW. Its area is as low as 0.0064 mm2 and post-layout simulations show good performances of 12.8 ppm output voltage variations over 250°C and an output voltage variation of 1.4 mV for a supply voltage sweep between 1.0 V and 1.25 V.