Raman spectroscopy and X-ray diffraction studies of stress effects in PbTiO3 thin films
Résumé
A systematic study of domain structure and residual stress evolution with film thickness and of phase transition in c/a epitaxial PbTiO3/LaAlO3 films using X-ray diffraction and Raman spectroscopy is reported. Both techniques revealed that the films are under tensile residual stress in the film plane and that a-domains are more stressed than c-domains. The two components of the large A1(TO) Raman modes are associated with a- and c-domains and their intensity ratio correlates to the volume fraction of a-domains. The evolution of the Raman signature with temperature revealed that the spectrum of a-domains disappears around 480°C whereas c-domains present an anomaly in their spectrum at 500°C but maintain a well-defined Raman signature up to 600°C.
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