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Article Dans Une Revue Materials Science and Engineering: A Année : 2007

Dislocation structure misorientations measured with an automated TEM diffraction pattern indexing tool

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hal-00197055 , version 1 (14-12-2007)

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  • HAL Id : hal-00197055 , version 1

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G. Shigesato, E. Rauch. Dislocation structure misorientations measured with an automated TEM diffraction pattern indexing tool. Materials Science and Engineering: A, 2007, 462, pp.402-406. ⟨hal-00197055⟩

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