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Communication Dans Un Congrès Metallurgical and Materials Transactions B Année : 2007

Control of impurity concentration in silicon by measurement of undercooling under electromagnetic levitation

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hal-00196309 , version 1 (12-12-2007)

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  • HAL Id : hal-00196309 , version 1

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M. Beaudhuin, K. Zaidat, T. Duffar, M. Lemiti. Control of impurity concentration in silicon by measurement of undercooling under electromagnetic levitation. 15th International Conference on Crystal growth, 2007, Salt Lake City, United States. pp.347-349. ⟨hal-00196309⟩

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