An Optical Boundary Scan Cell for On Line Testing of Embedded Systems - Archive ouverte HAL
Communication Dans Un Congrès Année : 2003

An Optical Boundary Scan Cell for On Line Testing of Embedded Systems

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Dates et versions

hal-00194665 , version 1 (07-12-2007)

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  • HAL Id : hal-00194665 , version 1

Citer

H. Chemali, A. Latoui, Chouki Aktouf. An Optical Boundary Scan Cell for On Line Testing of Embedded Systems. The 2003 International Conference on Embedded Systems and Applications (ESA'03), 2003, Las Vegas, Nevada, United States. pp.155-160. ⟨hal-00194665⟩

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