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Article Dans Une Revue Chemical Physics Année : 2006

XPS valence band spectra and theoretical calculations for investigations on thiogermanate and thiosilicate glasses

Résumé

This paper reports on investigations of thiogermanate and thiosilicate crystals and glasses by means of XPS valence band spectra and theoretical calculations (FLAPW method). The calculations were achieved on three crystallized phases GeS2, Na2GeS3 and SiS2 and valence band spectra (visualization of the occupied electronic density of states) were precisely interpreted through modulated density of states and charge density maps. This information was used to go further in the structural investigations of some thiogermanate and thiosilicate glasses. In sodium thiogermanates, an increase in Ge–Ge bonds was revealed as the modifier content (Na2S) increases. In thiosilicates, the evolution of the valence spectra according to the nature of the alkaline atoms (Li, Na) has been interpreted as changes in the local connectivity of units (edge or corner sharing tetrahedra). This study exhibits the potentialities of valence band spectra to provide information on glassy systems.

Dates et versions

hal-00185016 , version 1 (05-11-2007)

Identifiants

Citer

Dominique Foix, Hervé Martinez, A. Pradel, M. Ribes, Danielle Gonbeau. XPS valence band spectra and theoretical calculations for investigations on thiogermanate and thiosilicate glasses. Chemical Physics, 2006, 323 (2-3), pp.606-616. ⟨10.1016/j.chemphys.2005.10.037⟩. ⟨hal-00185016⟩
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