Strategy for designing accelerated ageing tests to evaluate IGBT power modules lifetime in real operation mode - Archive ouverte HAL
Article Dans Une Revue IEEE Transactions on Components and Packaging Technologies Année : 2003
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hal-00183575 , version 1 (30-10-2007)

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  • HAL Id : hal-00183575 , version 1

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Jean-Marc Thebaud, Eric Woirgard, Christian Zardini, Stéphane Azzopardi, Olivier Briat, et al.. Strategy for designing accelerated ageing tests to evaluate IGBT power modules lifetime in real operation mode. IEEE Transactions on Components and Packaging Technologies, 2003, 26, pp.429-438. ⟨hal-00183575⟩
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