Light-ion beam analysis for microelectronic applications - Archive ouverte HAL
Journal Articles Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Year : 2005

Light-ion beam analysis for microelectronic applications

P. Moretto
  • Function : Author
L. Serani
  • Function : Author
F. Natali
  • Function : Author
B. Damilano
J.Y. Duboz
  • Function : Author
J.L. Reverchon
  • Function : Author
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Dates and versions

hal-00183524 , version 1 (30-10-2007)

Identifiers

  • HAL Id : hal-00183524 , version 1

Cite

Lionel Hirsch, Pascal Tardy, Guillaume Wantz, Nolwen Huby, P. Moretto, et al.. Light-ion beam analysis for microelectronic applications. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2005, 240, pp.1. ⟨hal-00183524⟩
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