Intra-IC Inspection and Metrology with Picosecond Laser Ultrasonics - Archive ouverte HAL Access content directly
Conference Papers Year : 2005
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hal-00182901 , version 1 (29-10-2007)

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  • HAL Id : hal-00182901 , version 1

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Grégory Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Pascal Fouillat, et al.. Intra-IC Inspection and Metrology with Picosecond Laser Ultrasonics. 22nd IEEE Instrumentation and Measurement Technology Conference (IMTC) 2005, 2005, Canada. pp.1. ⟨hal-00182901⟩
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