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Communication Dans Un Congrès Année : 1993

approach of integrated circuits failure location by voltage contrast in a scanning electron microscope

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hal-00181909 , version 1 (24-10-2007)

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  • HAL Id : hal-00181909 , version 1

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François Marc, Hélène Fremont, Paul Jounet, Yves Danto, M. Barre, et al.. approach of integrated circuits failure location by voltage contrast in a scanning electron microscope. ESREF, 1993, France. pp.1. ⟨hal-00181909⟩
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