Conference Papers
Year : 2006
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https://hal.science/hal-00181691
Submitted on : Wednesday, October 24, 2007-11:48:40 AM
Last modification on : Tuesday, March 26, 2024-5:44:13 PM
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- HAL Id : hal-00181691 , version 1
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L. Shi, G. Lorito, Sebastien Fregonese, Vladimir Jovanovic, L. K. Nanver. JFET test structures for monitoring strain-enhanced mobility. SAFE 2006, Nov 2006, Netherlands. ⟨hal-00181691⟩
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