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Conference Papers Year : 2006

JFET test structures for monitoring strain-enhanced mobility

L. Shi
  • Function : Author
G. Lorito
  • Function : Author
Sebastien Fregonese
Vladimir Jovanovic
  • Function : Author
L. K. Nanver
  • Function : Author

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Dates and versions

hal-00181691 , version 1 (24-10-2007)

Identifiers

  • HAL Id : hal-00181691 , version 1

Cite

L. Shi, G. Lorito, Sebastien Fregonese, Vladimir Jovanovic, L. K. Nanver. JFET test structures for monitoring strain-enhanced mobility. SAFE 2006, Nov 2006, Netherlands. ⟨hal-00181691⟩
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