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Article Dans Une Revue Microelectronics Reliability Année : 2007

Near-field EMC study to improve electronic component reliability

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hal-00180353 , version 1 (18-10-2007)

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  • HAL Id : hal-00180353 , version 1

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Geneviève Duchamp, Didier Castagnet, Alain Meresse. Near-field EMC study to improve electronic component reliability. Microelectronics Reliability, 2007, 47 (9-11), pp.1668-1672. ⟨hal-00180353⟩
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