Oxidised Porous Silicon / Disperse Red 1 composite material: Fabrication and micro-Raman spectrometry analysis - Archive ouverte HAL
Communication Dans Un Congrès Année : 2004

Oxidised Porous Silicon / Disperse Red 1 composite material: Fabrication and micro-Raman spectrometry analysis

Résumé

Single porous silicon layers (60%, 70% and 80% porosity) and double porous silicon layers with two different porosities (80%-73% and 73%-80%) were completely oxidised and then filled by Disperse Red One molecules (referred to as DR1). The formed composite materials were characterised by optical reflectivity measurements and micro-Raman spectrometry in order to probe the DR1 relative concentration profile along the porous layers. In the single layers, the Raman signals linearly increase with porosity starting from a critical value (estimated at 40% before oxidation). On the contrary, in the case of double layer systems, the DR1 filling was always higher in the low porosity layer.

Dates et versions

hal-00154011 , version 1 (12-06-2007)

Identifiants

Citer

Mohammed Guendouz, M. Kloul, Severine Haesaert, Pierre Joubert, Jean-François Bardeau, et al.. Oxidised Porous Silicon / Disperse Red 1 composite material: Fabrication and micro-Raman spectrometry analysis. Porous Semiconductors - Science and Technology 4th international conference (PSST 2004), Mar 2004, Cullera-Valencia, Spain. pp.3453-3456, ⟨10.1002/pssc.200461218⟩. ⟨hal-00154011⟩
67 Consultations
0 Téléchargements

Altmetric

Partager

More