Measurement of the third order nonlinear properties of conjugated polymers embedded in porous silicon and silica - Archive ouverte HAL
Communication Dans Un Congrès Année : 2005

Measurement of the third order nonlinear properties of conjugated polymers embedded in porous silicon and silica

Résumé

Third order nonlinear properties of new composite materials obtained by embedding conjugate polymers in porous silicon and silica matrices are measured in near infrared. A new technique so-called "I-scan" was used as alternative to the classical z-scan, since better adapted to the particular form of samples. The picoseconds measurements show a significant increase of the nonlinear refractive index not only with respect to the standard optical materials but also to the bulk conjugated polymers. Embedding of PTS, PT12, and PPV in nanopores enhances considerably their already very large nonlinear refraction index and lower their overall absorption due to a negative nonlinear absorption.

Dates et versions

hal-00153779 , version 1 (11-06-2007)

Identifiants

Citer

C. Simos, L. Rodriguez, Vladimir Skarka, P. X. Nguyen, Nicolas Errien, et al.. Measurement of the third order nonlinear properties of conjugated polymers embedded in porous silicon and silica. Porous Semiconductors - Science and Technology 4th international conference (PSST 2004), Mar 2004, Cullera-Valencia, Spain. pp.3232-3236, ⟨10.1002/pssc.200461127⟩. ⟨hal-00153779⟩
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