Multilayers of PbZr0.52Ti0.48O3 (PZT) or SrBi2Nb2O9 (SBN) ferroelectrics (F) and YBa2Cu3O7 (YBaCuO) superconductor (S) have been grown by pulsed laser deposition. F/S or S/F bilayers as well as S/F/S trilayers deposited on SrTiO3 and MgO were epitaxially grown, as evidenced by x-ray diffraction (XRD) inθ -2θ and φ-scans modes, reflection high energy electron diffraction (RHEED) or electron channeling patterns (ECP). Superconducting YBaCuO films deposited on PZT exhibit a critical temperature, Tc, of about 86 K slightly below the value routinely obtained in the same deposition conditions on bare (100)SrTiO3 substrate (typically 88-89 K). By contrast, the Tc of YBaCuO films on SBN, either on (100)SrTiO3 or on (100)MgO is close to 88-89 K suggesting that SBN can be a good candidate as ferroelectric buffer layer for the growth of YBaCuO, especially on MgO for which a graphoepitaxial mechanism tends to limit the YBaCuO growth quality. In the case of F/S layers, hysteresis loops of PZT on YBaCuO show a saturated polarization larger than 30 µC/cm2 and a coercive field of about 70 kV/cm. Secondary ion mass spectrometry (SIMS) experiments have been performed in order to correlate interdiffusion mechanisms with both structural data and physical properties.