Conference Papers
Year : 2006
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https://hal.science/hal-00147965
Submitted on : Monday, May 21, 2007-2:28:04 PM
Last modification on : Thursday, April 4, 2024-6:25:47 PM
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- HAL Id : hal-00147965 , version 1
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B. Ivira, F. Ndagijimana, R.Y. Fillit. De-embedding technique for S-parameter measurements under high RF power, coupled to thermal imaging. IEEE ARFTG conference 2006 (MTT-S), 2006, San Francisco, United States. pp.XX. ⟨hal-00147965⟩
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