De-embedding technique for S-parameter measurements under high RF power, coupled to thermal imaging - Archive ouverte HAL Access content directly
Conference Papers Year : 2006

De-embedding technique for S-parameter measurements under high RF power, coupled to thermal imaging

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hal-00147965 , version 1 (21-05-2007)

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  • HAL Id : hal-00147965 , version 1

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B. Ivira, F. Ndagijimana, R.Y. Fillit. De-embedding technique for S-parameter measurements under high RF power, coupled to thermal imaging. IEEE ARFTG conference 2006 (MTT-S), 2006, San Francisco, United States. pp.XX. ⟨hal-00147965⟩

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