Article Dans Une Revue Journal of Applied Physics Année : 2006

Evidence of the magnetoimpedance effect up to microwave frequencies in polycristalline LaSrMnO films

Résumé

We present broadband measurements of the magnetoimpedance of polycrystalline films grown on silicon as a function of three parameters: (i) the frequency ⁠, (ii) the temperature ⁠, and (iii) the applied magnetic field ⁠. In this paper it is evidenced that the magnetoresistive effect still exists up to ⁠. The impedance variation with the frequency is well modeled considering that the polycrystalline film is equivalent to a random resistive-capacitive network. Similar behaviors of the impedance versus temperature variation are observed in dc and high frequency range.

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Dates et versions

hal-00146061 , version 1 (14-05-2007)

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Dana Stanescu, Pascal Xavier, Jacques Richard, Catherine Dubourdieu. Evidence of the magnetoimpedance effect up to microwave frequencies in polycristalline LaSrMnO films. Journal of Applied Physics, 2006, 99 (7), pp.73707-1/73707-7. ⟨10.1063/1.2189202⟩. ⟨hal-00146061⟩
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