Evidence of the magnetoimpedance effect up to microwave frequencies in polycristalline LaSrMnO films
Résumé
We present broadband measurements of the magnetoimpedance of polycrystalline films grown on silicon as a function of three parameters: (i) the frequency , (ii) the temperature , and (iii) the applied magnetic field . In this paper it is evidenced that the magnetoresistive effect still exists up to . The impedance variation with the frequency is well modeled considering that the polycrystalline film is equivalent to a random resistive-capacitive network. Similar behaviors of the impedance versus temperature variation are observed in dc and high frequency range.