Journal Articles Solid-State Electronics Year : 2006

Low temperature characterization of effective mobility in uniaxially and biaxially strained N-MOSFETs

F. Lime
  • Function : Author
F. Andrieu
  • Function : Author
J. Derix
  • Function : Author
F. Boeuf
T. Skotnicki
  • Function : Author
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Dates and versions

hal-00145112 , version 1 (07-05-2007)

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  • HAL Id : hal-00145112 , version 1

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F. Lime, F. Andrieu, J. Derix, Gérard Ghibaudo, F. Boeuf, et al.. Low temperature characterization of effective mobility in uniaxially and biaxially strained N-MOSFETs. Solid-State Electronics, 2006, 50, pp.644. ⟨hal-00145112⟩

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