Combination of computational crystal plasticity modelling and microstrain field measurements techniques for the analysis of TiAl behaviour - Archive ouverte HAL
Communication Dans Un Congrès Année : 2005

Combination of computational crystal plasticity modelling and microstrain field measurements techniques for the analysis of TiAl behaviour

Fichier non déposé

Dates et versions

hal-00133673 , version 1 (27-02-2007)

Identifiants

  • HAL Id : hal-00133673 , version 1

Citer

Jean Louis Chaboche, Eva Heripre, Arjen Roos, Jerome Crepin. Combination of computational crystal plasticity modelling and microstrain field measurements techniques for the analysis of TiAl behaviour. ASME McMAt 2005, Jun 2005, Baton Rouge, United States. ⟨hal-00133673⟩
161 Consultations
0 Téléchargements

Partager

More