Combination of computational crystal plasticity modelling and microstrain field measurements techniques for the analysis of TiAl behaviour - Archive ouverte HAL
Conference Papers Year : 2005

Combination of computational crystal plasticity modelling and microstrain field measurements techniques for the analysis of TiAl behaviour

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hal-00133673 , version 1 (27-02-2007)

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  • HAL Id : hal-00133673 , version 1

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Jean Louis Chaboche, Eva Heripre, Arjen Roos, Jerome Crepin. Combination of computational crystal plasticity modelling and microstrain field measurements techniques for the analysis of TiAl behaviour. ASME McMAt 2005, Jun 2005, Baton Rouge, United States. ⟨hal-00133673⟩
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