Conference Papers
Year : 2005
Jerome Crepin : Connect in order to contact the contributor
https://hal.science/hal-00133673
Submitted on : Tuesday, February 27, 2007-2:08:47 PM
Last modification on : Tuesday, August 27, 2024-12:40:13 PM
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- HAL Id : hal-00133673 , version 1
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Jean Louis Chaboche, Eva Heripre, Arjen Roos, Jerome Crepin. Combination of computational crystal plasticity modelling and microstrain field measurements techniques for the analysis of TiAl behaviour. ASME McMAt 2005, Jun 2005, Baton Rouge, United States. ⟨hal-00133673⟩
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